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Innova AFM Scan ranges up to XY= 90 mm2 , Z=7.5 mm and 5 mm2 Z=1.5 mm2, Available modes: Contact Mode (air), Tapping Mode (air), PhaseImaging, Lift Mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Dark Lift, Lateral Force, Microscopy, Nano-Indentation, Scanning Tunneling Microscopy STM, Low Current STM, Conductive AFM, STM with EC, Contact and Tapping Modes with EC, Surface Potential, Piezoresponse, Scanning Capacitance, Force Modulation. Applications: Material surface topography
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Contact Angle Goniometer The Contact Angle Goniometer provides a fast, reliable, and easy method to measure contact angles and surface tensions of liquid droplets. Features: Measurement Accuracy ± 1o Measurement Range 5o - 180o Stage Area 50 mm x 50 mm Maximum Sample Thickness 20 mm Maximum Camera Resolution 1920 x 1080 Applications: Thin Film Scale-Up Material/Solvent Compatibility Substrate Cleaning Hydrophobic Coatings
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